From ecbef00296f123a068e29acbd5d84463a1ad9934 Mon Sep 17 00:00:00 2001
From: David Woodhouse <David.Woodhouse@intel.com>
Date: Tue, 20 Oct 2009 22:02:41 +0900
Subject: [PATCH] --- yaml --- r: 176926 b: refs/heads/master c:
 1cc523999e0acd0c21f83bf89b7a44b4ab6f7bd8 h: refs/heads/master v: v3

---
 [refs]                            |  2 +-
 trunk/drivers/mtd/nand/mxc_nand.c | 16 +---------------
 2 files changed, 2 insertions(+), 16 deletions(-)

diff --git a/[refs] b/[refs]
index 3bce60fa440c..ed7c0d777fab 100644
--- a/[refs]
+++ b/[refs]
@@ -1,2 +1,2 @@
 ---
-refs/heads/master: 6f4e137e9af8745ccaddaf5dcb037a1175089e1c
+refs/heads/master: 1cc523999e0acd0c21f83bf89b7a44b4ab6f7bd8
diff --git a/trunk/drivers/mtd/nand/mxc_nand.c b/trunk/drivers/mtd/nand/mxc_nand.c
index ef3e1998b591..06c531485df9 100644
--- a/trunk/drivers/mtd/nand/mxc_nand.c
+++ b/trunk/drivers/mtd/nand/mxc_nand.c
@@ -857,17 +857,6 @@ static void mxc_nand_command(struct mtd_info *mtd, unsigned command,
 	}
 }
 
-/* Define some generic bad / good block scan pattern which are used
- * while scanning a device for factory marked good / bad blocks. */
-static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
-
-static struct nand_bbt_descr smallpage_memorybased = {
-	.options = NAND_BBT_SCAN2NDPAGE,
-	.offs = 5,
-	.len = 1,
-	.pattern = scan_ff_pattern
-};
-
 static int __init mxcnd_probe(struct platform_device *pdev)
 {
 	struct nand_chip *this;
@@ -984,10 +973,7 @@ static int __init mxcnd_probe(struct platform_device *pdev)
 		goto escan;
 	}
 
-	if (mtd->writesize == 2048) {
-		host->pagesize_2k = 1;
-		this->badblock_pattern = &smallpage_memorybased;
-	}
+	host->pagesize_2k = (mtd->writesize == 2048) ? 1 : 0;
 
 	if (this->ecc.mode == NAND_ECC_HW) {
 		switch (mtd->oobsize) {