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yaml
---
r: 197217
b: refs/heads/master
c: e5c003a
h: refs/heads/master
i:
  197215: bc8075c
v: v3
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Jonathan Cameron authored and Greg Kroah-Hartman committed May 11, 2010
1 parent 13333e0 commit 4c27fce
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Showing 2 changed files with 42 additions and 5 deletions.
2 changes: 1 addition & 1 deletion [refs]
Original file line number Diff line number Diff line change
@@ -1,2 +1,2 @@
---
refs/heads/master: f3fb001191a38a81bbc3cb363af2c279609ecc7c
refs/heads/master: e5c003ae82865c43feca9e11fb291ec2304a63d1
45 changes: 41 additions & 4 deletions trunk/drivers/staging/iio/iio.h
Original file line number Diff line number Diff line change
Expand Up @@ -96,6 +96,7 @@ void iio_remove_event_from_list(struct iio_event_handler_list *el,
* control method is used
* @scan_count: [INTERN] the number of elements in the current scan mode
* @scan_mask: [INTERN] bitmask used in masking scan mode elements
* @available_scan_masks: [DRIVER] optional array of allowed bitmasks
* @scan_timestamp: [INTERN] does the scan mode include a timestamp
* @trig: [INTERN] current device trigger (ring buffer modes)
* @pollfunc: [DRIVER] function run on trigger being recieved
Expand All @@ -122,7 +123,8 @@ struct iio_dev {
struct attribute_group *scan_el_attrs;
int scan_count;

u16 scan_mask;
u32 scan_mask;
u32 *available_scan_masks;
bool scan_timestamp;
struct iio_trigger *trig;
struct iio_poll_func *pollfunc;
Expand All @@ -132,22 +134,57 @@ struct iio_dev {
* These are mainly provided to allow for a change of implementation if a device
* has a large number of scan elements
*/
#define IIO_MAX_SCAN_LENGTH 15
#define IIO_MAX_SCAN_LENGTH 31

/* note 0 used as error indicator as it doesn't make sense. */
static inline u32 iio_scan_mask_match(u32 *av_masks, u32 mask)
{
while (*av_masks) {
if (!(~*av_masks & mask))
return *av_masks;
av_masks++;
}
return 0;
}

static inline int iio_scan_mask_query(struct iio_dev *dev_info, int bit)
{
u32 mask;

if (bit > IIO_MAX_SCAN_LENGTH)
return -EINVAL;

if (!dev_info->scan_mask)
return 0;

if (dev_info->available_scan_masks)
mask = iio_scan_mask_match(dev_info->available_scan_masks,
dev_info->scan_mask);
else
return !!(dev_info->scan_mask & (1 << bit));
mask = dev_info->scan_mask;

if (!mask)
return -EINVAL;

return !!(mask & (1 << bit));
};

static inline int iio_scan_mask_set(struct iio_dev *dev_info, int bit)
{
u32 mask;
u32 trialmask = dev_info->scan_mask | (1 << bit);

if (bit > IIO_MAX_SCAN_LENGTH)
return -EINVAL;
dev_info->scan_mask |= (1 << bit);
if (dev_info->available_scan_masks) {
mask = iio_scan_mask_match(dev_info->available_scan_masks,
trialmask);
if (!mask)
return -EINVAL;
}
dev_info->scan_mask = trialmask;
dev_info->scan_count++;

return 0;
};

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